XPT801 is a Class 1 sound level meter and frequency analyser.
Compared to the XPT800, the top level within the Expert Line sound level meters, the XPT801 offers optimized price-performance ratio with a streamlined set of features and top-notch performance tailored to the specific needs of acoustic professionals.
Built on a scalable platform, the XPT801 can adapt to evolving requirements, ensuring accuracy, high performance, and ease of use through the incorporation of cutting-edge technologies and expert input. Its features and performance are presented in a lighter version compared to the top of the range, providing an excellent price-performance value without compromising on reliability. Ideal for applications such as environmental noise monitoring, workplace noise exposure assessment, and a variety of industrial and laboratory uses.
Features of the XPT801 Sound Level Meter:
- Compact and Lightweight: Easy to transport and use in various locations for on-site noise assessments.
- High Versatility: Interchangeable microphones with auto-identification for a wide range of applications in a single upgradable device.
- Large Color Touch Screen Display: 4.3” vibrant color touch screen for easy navigation and monitoring.
- Durable Construction: Made with rugged materials to withstand harsh field conditions.
- Versatile Storage Options: Internal storage starting from 4GB on eMMC, μSD expansion slot.
- Seamless Wireless Connectivity: Includes embedded Wi-Fi, 4G LAN, USB-C, and RS232/485 interfaces for data transfer and remote control capabilities.
- High Dynamic Range: Dynamic range exceeding 120dB for accurate measurements.
- Long-lasting Battery Life: Internal rechargeable battery with smart power management, supporting more than 24 hours of continuous measurement campaigns.
- Automated Event Identification: Unattended noise monitoring with automatic audio recordings for efficient data collection.
- Advanced Trigger and Logging Capabilities: Unique logging features and advanced trigger logic with exceedances detection on broad levels and spectrum masks for detailed analysis.
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